Quantum Confinement and Charge Control in Deep Mesa Etched Quantum Wire evices

Dejan Jovanovic; Jean Pierre Leburton

doi:10.1109/55.215083

Quantum Confinement and Charge Control in Deep Mesa Etched Quantum Wire evices

Dejan Jovanovic, Jean Pierre Leburton

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Novel aspects of charge confinement in quantum wires are investigated with a self-consistent Schrodinger-Poisson model in the high-temperature regime. A decreasing eigenenergy separation with gate bias is revealed which differs from the behavior observed in 2D devices. In addition, charge control is examined and an analytical approximation relating charge density to gate bias is obtained.

Original language	English (US)
Pages (from-to)	7-9
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	14
Issue number	1
DOIs	https://doi.org/10.1109/55.215083
State	Published - Jan 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Online availability

10.1109/55.215083

Library availability

Discover UIUC Full Text

Cite this

@article{160cf81416fc40dc9cfd7ad42e68d84e,

title = "Quantum Confinement and Charge Control in Deep Mesa Etched Quantum Wire evices",

abstract = "Novel aspects of charge confinement in quantum wires are investigated with a self-consistent Schrodinger-Poisson model in the high-temperature regime. A decreasing eigenenergy separation with gate bias is revealed which differs from the behavior observed in 2D devices. In addition, charge control is examined and an analytical approximation relating charge density to gate bias is obtained.",

author = "Dejan Jovanovic and Leburton, {Jean Pierre}",

note = "Funding Information: Manuscript received August 5, 1992; revised October 21, 1992. This work was supported by the Joint Services Electronics Program and the National Science Foundation under Grant ECS-9108300. The authors are with the Beckman Institute for Advanced Science and Technology and the Department of Electrical and Computer Engineering, University of Illinois, Champaign-Urbana, IL 61820. IEEE Log Number 9205514.",

year = "1993",

month = jan,

doi = "10.1109/55.215083",

language = "English (US)",

volume = "14",

pages = "7--9",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Quantum Confinement and Charge Control in Deep Mesa Etched Quantum Wire evices

AU - Jovanovic, Dejan

AU - Leburton, Jean Pierre

N1 - Funding Information: Manuscript received August 5, 1992; revised October 21, 1992. This work was supported by the Joint Services Electronics Program and the National Science Foundation under Grant ECS-9108300. The authors are with the Beckman Institute for Advanced Science and Technology and the Department of Electrical and Computer Engineering, University of Illinois, Champaign-Urbana, IL 61820. IEEE Log Number 9205514.

PY - 1993/1

Y1 - 1993/1

N2 - Novel aspects of charge confinement in quantum wires are investigated with a self-consistent Schrodinger-Poisson model in the high-temperature regime. A decreasing eigenenergy separation with gate bias is revealed which differs from the behavior observed in 2D devices. In addition, charge control is examined and an analytical approximation relating charge density to gate bias is obtained.

AB - Novel aspects of charge confinement in quantum wires are investigated with a self-consistent Schrodinger-Poisson model in the high-temperature regime. A decreasing eigenenergy separation with gate bias is revealed which differs from the behavior observed in 2D devices. In addition, charge control is examined and an analytical approximation relating charge density to gate bias is obtained.

UR - http://www.scopus.com/inward/record.url?scp=0027306198&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027306198&partnerID=8YFLogxK

U2 - 10.1109/55.215083

DO - 10.1109/55.215083

M3 - Article

AN - SCOPUS:0027306198

SN - 0741-3106

VL - 14

SP - 7

EP - 9

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 1

ER -

Quantum Confinement and Charge Control in Deep Mesa Etched Quantum Wire evices

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this