Quantitative temperature measurements in high-pressure flames with multiline NO-LIF thermometry

Tonghun Lee, Wolfgang G. Bessler, Helmut Kronemayer, Christof Schulz, Jay B. Jeffries

Research output: Contribution to journalArticlepeer-review


An accurate temperature measurement technique for steady, high-pressure flames is investigated using excitation wavelength-scanned laser-induced fluorescence (LIF) within the nitric oxide (NO) A-X(0, 0) band, and demonstration experiments are performed in premixed methane/air flames at pressures between 1 and 60 bars with a fuel/air ratio of 0.9. Excitation spectra are simulated with a computational spectral simulation program (LIFSim) and fit to the experimental data to extract gas temperature. The LIF scan range was chosen to provide sensitivity over a wide temperature range and to minimize LIF interference from oxygen. The fitting method is robust against elastic scattering and broadband LIF interference from other species, and yields absolute, calibration-free temperature measurements. Because of loss of structure in the excitation spectra at high pressures, background signal intensities were determined using a NO addition method that simultaneously yields nascent NO concentrations in the postflame gases. In addition, fluorescence emission spectra were also analyzed to quantify the contribution of background signal and to investigate interference in the detection bandwidth. The NO-LIF temperatures are in good agreement with intrusive single-color pyrometry. The proposed thermometry method could provide a useful tool for studing high-pressure flame chemistry as well as provide a standard to evaluate and validate fast-imaging thermometry techniques for practical diagnostics of high-pressure combustion systems.

Original languageEnglish (US)
Pages (from-to)6718-6728
Number of pages11
JournalApplied Optics
Issue number31
StatePublished - Nov 1 2005
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering


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