Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Kyou Hyun Kim; Jian Min Zuo

doi:10.1017/S1431927615004900

Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Research output: Contribution to journal › Short survey › peer-review

Original language	English (US)
Pages (from-to)	821-822
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	21
Issue number	S3
DOIs	https://doi.org/10.1017/S1431927615004900
State	Published - 2015

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Instrumentation

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title = "Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique",

author = "Kim, {Kyou Hyun} and Zuo, {Jian Min}",

year = "2015",

doi = "10.1017/S1431927615004900",

language = "English (US)",

volume = "21",

pages = "821--822",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S3",

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AU - Kim, Kyou Hyun

AU - Zuo, Jian Min

PY - 2015

Y1 - 2015

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UR - http://www.scopus.com/inward/citedby.url?scp=84994651641&partnerID=8YFLogxK

U2 - 10.1017/S1431927615004900

DO - 10.1017/S1431927615004900

M3 - Short survey

AN - SCOPUS:84994651641

SN - 1431-9276

VL - 21

SP - 821

EP - 822

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S3

ER -

Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

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