Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Kyou Hyun Kim, Jian-Min Zuo

Research output: Contribution to journalShort survey

Original languageEnglish (US)
Pages (from-to)821-822
Number of pages2
JournalMicroscopy and Microanalysis
Volume21
Issue numberS3
DOIs
StatePublished - Jan 1 2015

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Electron diffraction
electron diffraction
symmetry

ASJC Scopus subject areas

  • Instrumentation

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Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique. / Kim, Kyou Hyun; Zuo, Jian-Min.

In: Microscopy and Microanalysis, Vol. 21, No. S3, 01.01.2015, p. 821-822.

Research output: Contribution to journalShort survey

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