Quantitative Infrared Photoelasticity of Silicon Photovoltaic Wafers Using a Discrete Dislocation Model

Keyphrases

• Wafer 100%
• Infrared Photoelasticity 100%
• Discrete Dislocations 100%
• Silicon Photovoltaics 100%
• Dislocation Model 100%
• Dislocation Structure 60%
• Strain Energy 40%
• Wafer Stress 40%
• Photoluminescence Measurements 20%
• Crystal Defects 20%
• Photoelastic Image 20%
• Stress Relaxation 20%
• Silicon Wafer 20%
• Residual Stress 20%
• Stress Mapping 20%
• Monocrystalline Silicon 20%
• Solar Cell Performance 20%
• Defects in Silicon 20%
• Slip System 20%
• Numerical Modeling Method 20%
• Inspection Method 20%
• Photoelastic Measurements 20%
• Solar Cell Reliability 20%

Engineering

• Dislocation Structure 100%
• Silicon Solar Cell 100%
• Strain Energy 66%
• Stress Relaxation 33%
• Residual Stress 33%
• Silicon Wafer 33%
• Slip System 33%
• Numerical Modeling 33%
• Inspection Method 33%
• Solar Cell 33%
• Monocrystalline Silicon 33%

Material Science

• Photoelasticity 100%
• Dislocation Structure 100%
• Silicon Solar Cell 100%
• Stress Relaxation 33%
• Solar Cell 33%
• Photoluminescence 33%
• Residual Stress 33%
• Silicon Wafer 33%