Abstract
Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.
Original language | English (US) |
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Pages (from-to) | 1622-1634 |
Number of pages | 13 |
Journal | Journal of Polymer Science, Part B: Polymer Physics |
Volume | 57 |
Issue number | 23 |
DOIs | |
State | Published - Dec 1 2019 |
Keywords
- coverage
- fractal dimension
- image analysis
- organic semiconductor
- solution processing
ASJC Scopus subject areas
- Condensed Matter Physics
- Physical and Theoretical Chemistry
- Polymers and Plastics
- Materials Chemistry