Quantitative Image Analysis of Fractal-Like Thin Films of Organic Semiconductors

Weikun Zhu, Erfan Mohammadi, Ying Diao

Research output: Contribution to journalArticle

Abstract

Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

Original languageEnglish (US)
Pages (from-to)1622-1634
Number of pages13
JournalJournal of Polymer Science, Part B: Polymer Physics
Volume57
Issue number23
DOIs
StatePublished - Dec 1 2019

Fingerprint

Semiconducting organic compounds
organic semiconductors
image analysis
Fractals
Image analysis
fractals
Thin films
Fractal dimension
thin films
coatings
Coatings
menisci
Film growth
MATLAB
Modulation
Semiconductor materials
modulation
Molecules
electronics
molecules

Keywords

  • coverage
  • fractal dimension
  • image analysis
  • organic semiconductor
  • solution processing

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Polymers and Plastics
  • Materials Chemistry

Cite this

Quantitative Image Analysis of Fractal-Like Thin Films of Organic Semiconductors. / Zhu, Weikun; Mohammadi, Erfan; Diao, Ying.

In: Journal of Polymer Science, Part B: Polymer Physics, Vol. 57, No. 23, 01.12.2019, p. 1622-1634.

Research output: Contribution to journalArticle

@article{8d97a0653d0b42ea857c9c073114cdc9,
title = "Quantitative Image Analysis of Fractal-Like Thin Films of Organic Semiconductors",
abstract = "Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.",
keywords = "coverage, fractal dimension, image analysis, organic semiconductor, solution processing",
author = "Weikun Zhu and Erfan Mohammadi and Ying Diao",
year = "2019",
month = "12",
day = "1",
doi = "10.1002/polb.24875",
language = "English (US)",
volume = "57",
pages = "1622--1634",
journal = "Journal of Polymer Science, Part B: Polymer Physics",
issn = "0887-6266",
publisher = "John Wiley and Sons Inc.",
number = "23",

}

TY - JOUR

T1 - Quantitative Image Analysis of Fractal-Like Thin Films of Organic Semiconductors

AU - Zhu, Weikun

AU - Mohammadi, Erfan

AU - Diao, Ying

PY - 2019/12/1

Y1 - 2019/12/1

N2 - Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

AB - Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

KW - coverage

KW - fractal dimension

KW - image analysis

KW - organic semiconductor

KW - solution processing

UR - http://www.scopus.com/inward/record.url?scp=85070938253&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85070938253&partnerID=8YFLogxK

U2 - 10.1002/polb.24875

DO - 10.1002/polb.24875

M3 - Article

AN - SCOPUS:85070938253

VL - 57

SP - 1622

EP - 1634

JO - Journal of Polymer Science, Part B: Polymer Physics

JF - Journal of Polymer Science, Part B: Polymer Physics

SN - 0887-6266

IS - 23

ER -