Quantitative characterization of the fracture surface of silicon single crystals by confocal microscopy

Yun-Biao Xin, K. Jimmy Hsia, David A. Lange

Research output: Book/Report/Conference proceeding › Book

Original language	English (US)
Place of Publication	Urbana
Publisher	Theoretical and Applied Mechanics, University of Illinois at Urbana-Champaign
State	Published - 1995

Library availability

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title = "Quantitative characterization of the fracture surface of silicon single crystals by confocal microscopy",

author = "Yun-Biao Xin and Hsia, {K. Jimmy} and Lange, {David A.}",

year = "1995",

language = "English (US)",

publisher = "Theoretical and Applied Mechanics, University of Illinois at Urbana-Champaign",

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TY - BOOK

T1 - Quantitative characterization of the fracture surface of silicon single crystals by confocal microscopy

AU - Xin, Yun-Biao

AU - Hsia, K. Jimmy

AU - Lange, David A.

PY - 1995

Y1 - 1995

UR - http://www.worldcat.org/oclc/33296798

M3 - Book

BT - Quantitative characterization of the fracture surface of silicon single crystals by confocal microscopy

PB - Theoretical and Applied Mechanics, University of Illinois at Urbana-Champaign

CY - Urbana

ER -