TY - JOUR
T1 - Quantitative analysis and optimization techniques for on-chip cache leakage power
AU - Kim, Nam Sung
AU - Blaauw, D.
AU - Mudge, T.
N1 - Funding Information:
Manuscript received November 10, 2003; revised July 26, 2004. This work was supported in part by the Intel Corporation, the National Science Foundation, and ARM plc, Cambridge, U.K. N. S. Kim is with the Circuit Research Laboratory, Intel Corporation, Hills-boro, OR 97124 USA (e-mail: [email protected]). D. Blaauw and T. Mudge are with the Advanced Computer Architecture Laboratory, University of Michigan, Ann Arbor, MI 48109 USA. Digital Object Identifier 10.1109/TVLSI.2005.859476
PY - 2005/10
Y1 - 2005/10
N2 - On-chip L1 and L2 caches represent a sizeable fraction of the total power consumption of microprocessors. In nanometer-scale technology, the subthreshold leakage power is becoming one of the dominant total power consumption components of those caches. In this study, we present optimization techniques to reduce the subthreshold leakage power of on-chip caches assuming that there are multiple threshold voltages, V/sub T/'s, available. First, we show a cache leakage optimization technique that examines the tradeoff between access time and subthreshold leakage power by assigning distinct V/sub T/'s to each of the four main cache components-address bus drivers, data bus drivers, decoders, and static random access memory (SRAM) cell arrays with sense amplifiers. Second, we show optimization techniques to reduce the leakage power of L1 and L2 on-chip caches without affecting the average memory access time. The key results are: 1) two additional high V/sub T/'s are enough to minimize leakage in a single cache-3 V/sub T/'s if we include a nominal low V/sub T/ for microprocessor core logic; 2) if L1 size is fixed, increasing L2 size can result in much lower leakage without reducing average memory access time; 3) if L2 size is fixed, reducing L1 size may result in lower leakage without loss of the average memory access time for the SPEC2K benchmarks; and 4) smaller L1 and larger L2 caches than are typical in today's processors result in significant leakage and dynamic power reduction without affecting the average memory access time.
AB - On-chip L1 and L2 caches represent a sizeable fraction of the total power consumption of microprocessors. In nanometer-scale technology, the subthreshold leakage power is becoming one of the dominant total power consumption components of those caches. In this study, we present optimization techniques to reduce the subthreshold leakage power of on-chip caches assuming that there are multiple threshold voltages, V/sub T/'s, available. First, we show a cache leakage optimization technique that examines the tradeoff between access time and subthreshold leakage power by assigning distinct V/sub T/'s to each of the four main cache components-address bus drivers, data bus drivers, decoders, and static random access memory (SRAM) cell arrays with sense amplifiers. Second, we show optimization techniques to reduce the leakage power of L1 and L2 on-chip caches without affecting the average memory access time. The key results are: 1) two additional high V/sub T/'s are enough to minimize leakage in a single cache-3 V/sub T/'s if we include a nominal low V/sub T/ for microprocessor core logic; 2) if L1 size is fixed, increasing L2 size can result in much lower leakage without reducing average memory access time; 3) if L2 size is fixed, reducing L1 size may result in lower leakage without loss of the average memory access time for the SPEC2K benchmarks; and 4) smaller L1 and larger L2 caches than are typical in today's processors result in significant leakage and dynamic power reduction without affecting the average memory access time.
KW - Aphilipp
KW - Cache leakage optimization
KW - Memory access time
KW - Microprocessor core logic
KW - Nanometer-scale technology
KW - On-chip cache leakage power optimization
KW - Subthreshold leakage power reduction
UR - http://www.scopus.com/inward/record.url?scp=31144435198&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=31144435198&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2005.859476
DO - 10.1109/TVLSI.2005.859476
M3 - Article
AN - SCOPUS:31144435198
SN - 1063-8210
VL - 13
SP - 1147
EP - 1156
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 10
ER -