Pyroelectric current measurements on PbZr0.2Ti 0.8O3 epitaxial layers

B. Bhatia; J. Karthik; T. Tong; David G. Cahill; L. W. Martin; W. P. King

doi:10.1063/1.4766271

Pyroelectric current measurements on PbZr_0.2Ti _0.8O₃ epitaxial layers

B. Bhatia, J. Karthik, T. Tong, David G. Cahill, L. W. Martin, W. P. King

Research output: Contribution to journal › Article › peer-review

Abstract

We report pyroelectric current measurements on 150 nm thick PbZr _0.2Ti_0.8O₃ (PZT) epitaxial films using frequency-domain thermal measurements over the range 0.02 Hz-1.3 MHz. The measured pyroelectric currents are proportional to the rate of temperature change, from ∼10^-5 A/m² to ∼10³ A/m² over the range 10^-2 to 10⁶ K/s. The film temperature oscillation is controlled using either a hotplate, microfabricated heater, or modulated laser, and the pyroelectric current is measured from a microelectrode fabricated onto the film. The measured pyroelectric coefficient of the PZT films is nearly constant across the entire frequency range at ≈-200 μC/m²K.

Original language	English (US)
Article number	104106
Journal	Journal of Applied Physics
Volume	112
Issue number	10
DOIs	https://doi.org/10.1063/1.4766271
State	Published - Nov 15 2012

ASJC Scopus subject areas

General Physics and Astronomy

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@article{bcd1db1300094a95a8947169c2bb9c91,

title = "Pyroelectric current measurements on PbZr0.2Ti 0.8O3 epitaxial layers",

abstract = "We report pyroelectric current measurements on 150 nm thick PbZr 0.2Ti0.8O3 (PZT) epitaxial films using frequency-domain thermal measurements over the range 0.02 Hz-1.3 MHz. The measured pyroelectric currents are proportional to the rate of temperature change, from ∼10-5 A/m2 to ∼103 A/m2 over the range 10-2 to 106 K/s. The film temperature oscillation is controlled using either a hotplate, microfabricated heater, or modulated laser, and the pyroelectric current is measured from a microelectrode fabricated onto the film. The measured pyroelectric coefficient of the PZT films is nearly constant across the entire frequency range at ≈-200 μC/m2K.",

author = "B. Bhatia and J. Karthik and T. Tong and Cahill, {David G.} and Martin, {L. W.} and King, {W. P.}",

note = "Funding Information: The authors gratefully acknowledge the support of ONR N00014-10-1-0525.",

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AU - Bhatia, B.

AU - Karthik, J.

AU - Tong, T.

AU - Cahill, David G.

AU - Martin, L. W.

AU - King, W. P.

N1 - Funding Information: The authors gratefully acknowledge the support of ONR N00014-10-1-0525.

PY - 2012/11/15

Y1 - 2012/11/15

N2 - We report pyroelectric current measurements on 150 nm thick PbZr 0.2Ti0.8O3 (PZT) epitaxial films using frequency-domain thermal measurements over the range 0.02 Hz-1.3 MHz. The measured pyroelectric currents are proportional to the rate of temperature change, from ∼10-5 A/m2 to ∼103 A/m2 over the range 10-2 to 106 K/s. The film temperature oscillation is controlled using either a hotplate, microfabricated heater, or modulated laser, and the pyroelectric current is measured from a microelectrode fabricated onto the film. The measured pyroelectric coefficient of the PZT films is nearly constant across the entire frequency range at ≈-200 μC/m2K.

AB - We report pyroelectric current measurements on 150 nm thick PbZr 0.2Ti0.8O3 (PZT) epitaxial films using frequency-domain thermal measurements over the range 0.02 Hz-1.3 MHz. The measured pyroelectric currents are proportional to the rate of temperature change, from ∼10-5 A/m2 to ∼103 A/m2 over the range 10-2 to 106 K/s. The film temperature oscillation is controlled using either a hotplate, microfabricated heater, or modulated laser, and the pyroelectric current is measured from a microelectrode fabricated onto the film. The measured pyroelectric coefficient of the PZT films is nearly constant across the entire frequency range at ≈-200 μC/m2K.

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