Progress towards quantitative electron nanodiffraction

J. M. Zuo, R. Twesten, B. Q. Li, J. Tao, Y. F. Shi, J. Bording, H. Chen, I. Petrov.

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)658-659
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2002

ASJC Scopus subject areas

  • Instrumentation

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