Progress towards quantitative electron nanodiffraction

J. M. Zuo; R. Twesten; B. Q. Li; J. Tao; Y. F. Shi; J. Bording; H. Chen; I. Petrov.

doi:10.1017/s1431927602106295

Progress towards quantitative electron nanodiffraction

J. M. Zuo, R. Twesten, B. Q. Li, J. Tao, Y. F. Shi, J. Bording, H. Chen, I. Petrov.

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	658-659
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	8
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927602106295
State	Published - 2002

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Instrumentation

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10.1017/s1431927602106295

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title = "Progress towards quantitative electron nanodiffraction",

author = "Zuo, {J. M.} and R. Twesten and Li, {B. Q.} and J. Tao and Shi, {Y. F.} and J. Bording and H. Chen and I. Petrov.",

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publisher = "Cambridge University Press",

number = "SUPPL. 2",

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AU - Zuo, J. M.

AU - Twesten, R.

AU - Li, B. Q.

AU - Tao, J.

AU - Shi, Y. F.

AU - Bording, J.

AU - Chen, H.

AU - Petrov., I.

PY - 2002

Y1 - 2002

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DO - 10.1017/s1431927602106295

M3 - Article

AN - SCOPUS:0036414497

SN - 1431-9276

VL - 8

SP - 658

EP - 659

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Progress towards quantitative electron nanodiffraction

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