Probing substrate-dependent long-range surface structure of single-layer and multilayer Mo S2 by low-energy electron microscopy and microprobe diffraction

Po Chun Yeh, Wencan Jin, Nader Zaki, Datong Zhang, Jerzy T. Sadowski, Abdullah Al-Mahboob, Arend M. Van Der Zande, Daniel A. Chenet, Jerry I. Dadap, Irving P. Herman, Peter Sutter, James Hone, Richard M. Osgood

Research output: Contribution to journalArticle

Abstract

The long-range surface structure of the dichalcogenide MoS2 is probed with nanometer-length spatial resolution using low-energy electron microscopy (LEEM) and microprobe low-energy electron diffraction (μ-LEED). The quality of two differently prepared types of MoS2, single-layer and multilayer exfoliated crystals, as well as single-layer chemical-vapor-deposition (CVD)-grown crystals, is examined. The effects induced by a supporting interface are examined by utilizing two different substrates, SiO2 and native-oxide-covered Si. In addition, the role of impurities is also studied by way of in situ deposition of the alkali-metal potassium. Microprobe measurements reveal that, unlike exfoliated MoS2, CVD-grown MoS2 may, in some instances, exhibit large-scale grain-boundary alterations due to the presence of surface strain during growth. However, real-space probing by LEEM in conjunction with k-space probing by μ-LEED shows that the quality of CVD-grown MoS2 can be comparable to that of exfoliated MoS2.

Original languageEnglish (US)
Article number155408
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume89
Issue number15
DOIs
StatePublished - Apr 4 2014
Externally publishedYes

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Surface structure
Electron microscopy
Chemical vapor deposition
electron microscopy
Multilayers
Diffraction
vapor deposition
Substrates
diffraction
Alkali Metals
Low energy electron diffraction
Alkali metals
alkali metals
Oxides
crystals
Potassium
energy
potassium
Grain boundaries
electron diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Probing substrate-dependent long-range surface structure of single-layer and multilayer Mo S2 by low-energy electron microscopy and microprobe diffraction. / Yeh, Po Chun; Jin, Wencan; Zaki, Nader; Zhang, Datong; Sadowski, Jerzy T.; Al-Mahboob, Abdullah; Van Der Zande, Arend M.; Chenet, Daniel A.; Dadap, Jerry I.; Herman, Irving P.; Sutter, Peter; Hone, James; Osgood, Richard M.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 89, No. 15, 155408, 04.04.2014.

Research output: Contribution to journalArticle

Yeh, Po Chun ; Jin, Wencan ; Zaki, Nader ; Zhang, Datong ; Sadowski, Jerzy T. ; Al-Mahboob, Abdullah ; Van Der Zande, Arend M. ; Chenet, Daniel A. ; Dadap, Jerry I. ; Herman, Irving P. ; Sutter, Peter ; Hone, James ; Osgood, Richard M. / Probing substrate-dependent long-range surface structure of single-layer and multilayer Mo S2 by low-energy electron microscopy and microprobe diffraction. In: Physical Review B - Condensed Matter and Materials Physics. 2014 ; Vol. 89, No. 15.
@article{dbec30a060794bdea9bf4d8eb86160c5,
title = "Probing substrate-dependent long-range surface structure of single-layer and multilayer Mo S2 by low-energy electron microscopy and microprobe diffraction",
abstract = "The long-range surface structure of the dichalcogenide MoS2 is probed with nanometer-length spatial resolution using low-energy electron microscopy (LEEM) and microprobe low-energy electron diffraction (μ-LEED). The quality of two differently prepared types of MoS2, single-layer and multilayer exfoliated crystals, as well as single-layer chemical-vapor-deposition (CVD)-grown crystals, is examined. The effects induced by a supporting interface are examined by utilizing two different substrates, SiO2 and native-oxide-covered Si. In addition, the role of impurities is also studied by way of in situ deposition of the alkali-metal potassium. Microprobe measurements reveal that, unlike exfoliated MoS2, CVD-grown MoS2 may, in some instances, exhibit large-scale grain-boundary alterations due to the presence of surface strain during growth. However, real-space probing by LEEM in conjunction with k-space probing by μ-LEED shows that the quality of CVD-grown MoS2 can be comparable to that of exfoliated MoS2.",
author = "Yeh, {Po Chun} and Wencan Jin and Nader Zaki and Datong Zhang and Sadowski, {Jerzy T.} and Abdullah Al-Mahboob and {Van Der Zande}, {Arend M.} and Chenet, {Daniel A.} and Dadap, {Jerry I.} and Herman, {Irving P.} and Peter Sutter and James Hone and Osgood, {Richard M.}",
year = "2014",
month = "4",
day = "4",
doi = "10.1103/PhysRevB.89.155408",
language = "English (US)",
volume = "89",
journal = "Physical Review B-Condensed Matter",
issn = "0163-1829",
publisher = "American Institute of Physics Publising LLC",
number = "15",

}

TY - JOUR

T1 - Probing substrate-dependent long-range surface structure of single-layer and multilayer Mo S2 by low-energy electron microscopy and microprobe diffraction

AU - Yeh, Po Chun

AU - Jin, Wencan

AU - Zaki, Nader

AU - Zhang, Datong

AU - Sadowski, Jerzy T.

AU - Al-Mahboob, Abdullah

AU - Van Der Zande, Arend M.

AU - Chenet, Daniel A.

AU - Dadap, Jerry I.

AU - Herman, Irving P.

AU - Sutter, Peter

AU - Hone, James

AU - Osgood, Richard M.

PY - 2014/4/4

Y1 - 2014/4/4

N2 - The long-range surface structure of the dichalcogenide MoS2 is probed with nanometer-length spatial resolution using low-energy electron microscopy (LEEM) and microprobe low-energy electron diffraction (μ-LEED). The quality of two differently prepared types of MoS2, single-layer and multilayer exfoliated crystals, as well as single-layer chemical-vapor-deposition (CVD)-grown crystals, is examined. The effects induced by a supporting interface are examined by utilizing two different substrates, SiO2 and native-oxide-covered Si. In addition, the role of impurities is also studied by way of in situ deposition of the alkali-metal potassium. Microprobe measurements reveal that, unlike exfoliated MoS2, CVD-grown MoS2 may, in some instances, exhibit large-scale grain-boundary alterations due to the presence of surface strain during growth. However, real-space probing by LEEM in conjunction with k-space probing by μ-LEED shows that the quality of CVD-grown MoS2 can be comparable to that of exfoliated MoS2.

AB - The long-range surface structure of the dichalcogenide MoS2 is probed with nanometer-length spatial resolution using low-energy electron microscopy (LEEM) and microprobe low-energy electron diffraction (μ-LEED). The quality of two differently prepared types of MoS2, single-layer and multilayer exfoliated crystals, as well as single-layer chemical-vapor-deposition (CVD)-grown crystals, is examined. The effects induced by a supporting interface are examined by utilizing two different substrates, SiO2 and native-oxide-covered Si. In addition, the role of impurities is also studied by way of in situ deposition of the alkali-metal potassium. Microprobe measurements reveal that, unlike exfoliated MoS2, CVD-grown MoS2 may, in some instances, exhibit large-scale grain-boundary alterations due to the presence of surface strain during growth. However, real-space probing by LEEM in conjunction with k-space probing by μ-LEED shows that the quality of CVD-grown MoS2 can be comparable to that of exfoliated MoS2.

UR - http://www.scopus.com/inward/record.url?scp=84899716611&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899716611&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.89.155408

DO - 10.1103/PhysRevB.89.155408

M3 - Article

AN - SCOPUS:84899716611

VL - 89

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 0163-1829

IS - 15

M1 - 155408

ER -