Probing interfacial electronic structures in atomic layer LaMnO3 and SrTiO3 superlattices

Amish B. Shah, Quentin M. Ramasse, Xiaofang Zhai, Jian Guo Wen, Steve J. May, Ivan Petrov, Anand Bhattacharya, Peter Abbamonte, James N. Eckstein, Jian Min Zuo

Research output: Contribution to journalArticlepeer-review

Abstract

The interfacial electronic structure characterization of a m×(LaMnO3)/n× (SrTiO3) superlattice based on scanning transmission electron microscopy and electron energy loss spectroscopy. Evidence of interfacial band alignment and electron transfer are presented based on the observation of O K edge of individual transition metal and oxygen atomic columns. Electron probe aberration correction was essential for the high spatial resolution mapping of interfacial electronic states.

Original languageEnglish (US)
Pages (from-to)1156-1160
Number of pages5
JournalAdvanced Materials
Volume22
Issue number10
DOIs
StatePublished - Mar 12 2010

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering

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