Abstract
The interfacial electronic structure characterization of a m×(LaMnO3)/n× (SrTiO3) superlattice based on scanning transmission electron microscopy and electron energy loss spectroscopy. Evidence of interfacial band alignment and electron transfer are presented based on the observation of O K edge of individual transition metal and oxygen atomic columns. Electron probe aberration correction was essential for the high spatial resolution mapping of interfacial electronic states.
Original language | English (US) |
---|---|
Pages (from-to) | 1156-1160 |
Number of pages | 5 |
Journal | Advanced Materials |
Volume | 22 |
Issue number | 10 |
DOIs | |
State | Published - Mar 12 2010 |
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering