Probing asymmetric interfaces of LaMnO3/SrMnO3 superlattices with aberration-corrected scanning transmission electron microscopy

A. B. Shah; S. J. May; J. G. Wen; X. Zhai; J. N. Eckstein; A. Bhattacharya; J. M. Zuo

doi:10.1017/S1431927608083529

Probing asymmetric interfaces of LaMnO₃/SrMnO₃ superlattices with aberration-corrected scanning transmission electron microscopy

A. B. Shah, S. J. May, J. G. Wen, X. Zhai, J. N. Eckstein, A. Bhattacharya, J. M. Zuo

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	18-19
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608083529
State	Published - Aug 2008

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@article{2953524b390544098439479025ed4c0a,

title = "Probing asymmetric interfaces of LaMnO3/SrMnO3 superlattices with aberration-corrected scanning transmission electron microscopy",

author = "Shah, {A. B.} and May, {S. J.} and Wen, {J. G.} and X. Zhai and Eckstein, {J. N.} and A. Bhattacharya and Zuo, {J. M.}",

year = "2008",

month = aug,

doi = "10.1017/S1431927608083529",

language = "English (US)",

volume = "14",

pages = "18--19",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Probing asymmetric interfaces of LaMnO3/SrMnO3 superlattices with aberration-corrected scanning transmission electron microscopy

AU - Shah, A. B.

AU - May, S. J.

AU - Wen, J. G.

AU - Zhai, X.

AU - Eckstein, J. N.

AU - Bhattacharya, A.

AU - Zuo, J. M.

PY - 2008/8

Y1 - 2008/8

UR - http://www.scopus.com/inward/record.url?scp=49549100891&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=49549100891&partnerID=8YFLogxK

U2 - 10.1017/S1431927608083529

DO - 10.1017/S1431927608083529

M3 - Article

AN - SCOPUS:49549100891

SN - 1431-9276

VL - 14

SP - 18

EP - 19

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2