Probabilistic-physics-of-failure/short-time-test approach to reliability assurance for high-performance chips: Models for deep-submicron transistors and optical interconnects

Keyphrases

• High Performance 100%
• Transistor 100%
• Deep Submicron 100%
• Optical Interconnects 100%
• Probabilistic Physics-of-failure 100%
• Chip Model 100%
• Reliability Assurance 100%
• Failure Time Distribution 100%
• Chip Reliability 66%
• Reliability Qualification 66%
• Rule-based 33%
• Design Change 33%
• Activation Energy Distribution 33%
• Long-term Reliability 33%
• Reliability Approach 33%
• Common Defects 33%
• Device Degradation 33%
• Latent Failures 33%
• Defect Activation 33%
• Semisymmetric 33%
• Failure Principle 33%
• Reliability Methodology 33%

Engineering

• Optical Interconnect 100%
• Failure Time 100%
• Activation Energy 33%
• Energy Distribution 33%
• Design Change 33%

Earth and Planetary Sciences

• Energy Distribution 100%