Fingerprint
Dive into the research topics of 'Predictive modeling of peak discharge current during charged device model test of microelectronic components'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Predictive modeling of peak discharge current during charged device model test of microelectronic components
Vrashank Shukla, Gianluca Boselli, Mariano Dissegna, Charvaka Duvvury, Raj Sankaralingam, Elyse Rosenbaum
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution