@inproceedings{083841c6f2ae4aa4bd490c9a67a8ab6b,
title = "Predictive modeling of peak discharge current during charged device model test of microelectronic components",
abstract = "This work presents a computationally efficient methodology to predict the peak CDM discharge current for a given pre-charge voltage. The methodology is applied to a variety of IC components in different types of packages; the peak current values obtained from simulations agree well with those obtained from FICDM measurements.",
author = "Vrashank Shukla and Gianluca Boselli and Mariano Dissegna and Charvaka Duvvury and Raj Sankaralingam and Elyse Rosenbaum",
year = "2013",
month = oct,
day = "16",
language = "English (US)",
isbn = "9781585372324",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013",
note = "2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 ; Conference date: 08-09-2013 Through 13-09-2013",
}