Abstract
This laboratory has recently developed a new process for the chemical vapor deposition of titanium disilicide on Si. The present work moves beyond the kinetic characterization of previous efforts to examine how this process works in terms of material properties, surface/interface roughness, dopant redistribution, nucleation control and selectivity/overgrowth on both SiO 2 and Si 3 N 4 . While questions remain about the surface structures responsible for nucleation, in all aspects examined here the process appears suitable for device fabrication.
Original language | English (US) |
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Pages (from-to) | 41-49 |
Number of pages | 9 |
Journal | Applied Surface Science |
Volume | 119 |
Issue number | 1-2 |
DOIs | |
State | Published - Sep 1997 |
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films