@inproceedings{7b1d7734a21249ef8951d28b6e8286cc,
title = "Practical methodology for the extraction of SEED models",
abstract = "A custom test board facilitates TLP characterization of the external pins of an integrated circuit. Models extracted from the data are used to simulate the pin-level response of the IC to an IEC 61000-4-2 discharge. ESD gun zaps are applied to the test board; simulated and measured waveforms are compared.",
author = "Collin Reiman and Nicholas Thomson and Yang Xiu and Robert Mertens and Elyse Rosenbaum",
year = "2015",
month = oct,
day = "30",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015",
note = "37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 ; Conference date: 27-09-2015 Through 02-10-2015",
}