TY - JOUR
T1 - Powder diffraction by fixed incident angle reflection using a curved position-sensitive detector
AU - Haggerty, Ryan P.
AU - Sarin, Pankaj
AU - Bérar, Jean Francois
AU - Apostolov, Zlatomir D.
AU - Kriven, Waltraud M.
PY - 2010
Y1 - 2010
N2 - As curved position-sensitive detectors improve in angular resolution, the effects that fixed incident angle reflection have on X-ray diffraction peaks become more apparent. In this study the effects of sample transparency, incident beam height, detector resolution and sample displacement on the intensity, location, width and shape of powder diffraction peaks were examined. The functions describing each of these phenomena are presented and were successfully used to quantitatively model the diffraction peaks collected in this geometry. Three distinct regimes of diffraction peak resolution were identified from the phenomena that limit the peak variance. Pertinent criteria based on experimental parameters have been outlined to classify fixed incident angle reflection experiments into each regime. Guidelines for improvement of experimental resolution and for conducting analysis of data acquired using fixed incident angle reflection geometry and curved position-sensitive detectors are also provided.
AB - As curved position-sensitive detectors improve in angular resolution, the effects that fixed incident angle reflection have on X-ray diffraction peaks become more apparent. In this study the effects of sample transparency, incident beam height, detector resolution and sample displacement on the intensity, location, width and shape of powder diffraction peaks were examined. The functions describing each of these phenomena are presented and were successfully used to quantitatively model the diffraction peaks collected in this geometry. Three distinct regimes of diffraction peak resolution were identified from the phenomena that limit the peak variance. Pertinent criteria based on experimental parameters have been outlined to classify fixed incident angle reflection experiments into each regime. Guidelines for improvement of experimental resolution and for conducting analysis of data acquired using fixed incident angle reflection geometry and curved position-sensitive detectors are also provided.
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U2 - 10.1107/S0021889810006400
DO - 10.1107/S0021889810006400
M3 - Article
AN - SCOPUS:77952503987
SN - 0021-8898
VL - 43
SP - 560
EP - 569
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
IS - 3
ER -