Powder diffraction by fixed incident angle reflection using a curved position-sensitive detector

Ryan P. Haggerty, Pankaj Sarin, Jean Francois Bérar, Zlatomir D. Apostolov, Waltraud M. Kriven

Research output: Contribution to journalArticlepeer-review

Abstract

As curved position-sensitive detectors improve in angular resolution, the effects that fixed incident angle reflection have on X-ray diffraction peaks become more apparent. In this study the effects of sample transparency, incident beam height, detector resolution and sample displacement on the intensity, location, width and shape of powder diffraction peaks were examined. The functions describing each of these phenomena are presented and were successfully used to quantitatively model the diffraction peaks collected in this geometry. Three distinct regimes of diffraction peak resolution were identified from the phenomena that limit the peak variance. Pertinent criteria based on experimental parameters have been outlined to classify fixed incident angle reflection experiments into each regime. Guidelines for improvement of experimental resolution and for conducting analysis of data acquired using fixed incident angle reflection geometry and curved position-sensitive detectors are also provided.

Original languageEnglish (US)
Pages (from-to)560-569
Number of pages10
JournalJournal of Applied Crystallography
Volume43
Issue number3
DOIs
StatePublished - May 24 2010

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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