Abstract

Three-dimensional optical microscopy suffers from the well-known compromise between transverse resolution and depth-of-field. This is true for both structural imaging methods and their functional extensions. Interferometric synthetic aperture microscopy (ISAM) is a solution to the 3D coherent microscopy inverse problem that provides depth-independent transverse resolution. We demonstrate the extension of ISAM to polarization sensitive imaging, termed polarization-sensitive interferometric synthetic aperture microscopy (PS-ISAM). This technique is the first functionalization of the ISAM method and provides improved depth-of-field for polarization-sensitive imaging. The basic assumptions of polarization-sensitive imaging are explored, and refocusing of birefringent structures is experimentally demonstrated. PS-ISAM enables high-resolution volumetric imaging of birefringent materials and tissue.

Original languageEnglish (US)
Article number211106
JournalApplied Physics Letters
Volume107
Issue number21
DOIs
StatePublished - Nov 23 2015

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    South, F. A., Liu, Y. Z., Xu, Y., Shemonski, N. D., Carney, P. S., & Boppart, S. A. (2015). Polarization-sensitive interferometric synthetic aperture microscopy. Applied Physics Letters, 107(21), [211106]. https://doi.org/10.1063/1.4936236