Abstract
Pd metal-oxide-semiconductor (MOS) devices can be used to detect energetic hydrogen atoms. H isotopes implanted into a Pd-MOS diode quickly diffuse through the Pd layer and are accommodated at available Pd-SiO2 interface sites, causing an increase in the leakage current through the device. We find that a diode's response to energetic hydrogen is rapid, sensitive, dosimetric, and reproducible. Pd-MOS diodes can be regenerated when saturated with hydrogen by heating to 100-200°C for a few minutes. These properties make Pd-MOS diodes useful for plasma-edge diagnosis of hydrogen particle fluence when the energy distribution of the incident hydrogen is known. Pd-MOS diode sensors have been used in the laboratory and in the ZT-40M reversed-field pinch to measure energetic hydrogen fluxes. Their small size allows placement in locations inaccessible to conventional diagnostics and should provide a means for remote monitoring of hydrogen fluxes to plasma-facing surfaces.
Original language | English (US) |
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Pages (from-to) | 587-592 |
Number of pages | 6 |
Journal | Journal of Nuclear Materials |
Volume | 162-164 |
Issue number | C |
DOIs | |
State | Published - Apr 1 1989 |
Keywords
- Pd-MOS diodes
- charge-exchange particles
- hydrogen-flux monitor
- plasma-edge diagnostics
- solid-state detectors
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- General Materials Science
- Nuclear Energy and Engineering