TY - GEN
T1 - Physics-based Compact Model of N-Well ESD Diodes
AU - Huang, Shudong
AU - Rosenbaum, Elyse
N1 - Publisher Copyright:
© 2023 ESD Association. All rights reserved.
PY - 2023
Y1 - 2023
N2 - This work presents a compact model for N-Well ESD diodes, including the parasitic PNP. A schematic representation of the model is similar to the SPICE Gummel-Poon model, but the implementation differs. The proposed model uses a non-quasi-static description of the stored charge, which facilitates accurate simulation of the diode’s transient response to ESD. The very high-level injection which occurs during ESD is modeled in a manner suitable for the parasitic PNP with its relatively large base width.
AB - This work presents a compact model for N-Well ESD diodes, including the parasitic PNP. A schematic representation of the model is similar to the SPICE Gummel-Poon model, but the implementation differs. The proposed model uses a non-quasi-static description of the stored charge, which facilitates accurate simulation of the diode’s transient response to ESD. The very high-level injection which occurs during ESD is modeled in a manner suitable for the parasitic PNP with its relatively large base width.
UR - http://www.scopus.com/inward/record.url?scp=85179012839&partnerID=8YFLogxK
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U2 - 10.23919/EOS/ESD58195.2023.10287734
DO - 10.23919/EOS/ESD58195.2023.10287734
M3 - Conference contribution
AN - SCOPUS:85179012839
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings
PB - ESD Association
T2 - 45th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023
Y2 - 2 October 2023 through 4 October 2023
ER -