Physics-based Compact Model of N-Well ESD Diodes

Shudong Huang, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work presents a compact model for N-Well ESD diodes, including the parasitic PNP. A schematic representation of the model is similar to the SPICE Gummel-Poon model, but the implementation differs. The proposed model uses a non-quasi-static description of the stored charge, which facilitates accurate simulation of the diode’s transient response to ESD. The very high-level injection which occurs during ESD is modeled in a manner suitable for the parasitic PNP with its relatively large base width.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings
PublisherESD Association
ISBN (Electronic)9781585373475
DOIs
StatePublished - 2023
Event45th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Riverside, United States
Duration: Oct 2 2023Oct 4 2023

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2023-October
ISSN (Print)0739-5159

Conference

Conference45th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023
Country/TerritoryUnited States
CityRiverside
Period10/2/2310/4/23

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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