TY - JOUR
T1 - Physical Modeling of Monolithic Self-Rolled-Up Microtube Interdigital Capacitors
AU - Luo, Xiang
AU - Yang, Zhendong
AU - Kraman, Mark
AU - Sang, Lei
AU - Zhang, Yong
AU - Li, Xiuling
AU - Huang, Wen
N1 - This work was supported in part by the National Natural Science Foundation of China under Grant 61974038; in part by the National Key Research and Development Program of China under Grant 2021YFA0715300; in part by the Fundamental Research Funds for the Central Universities of China under Grant JZ2020HGPB0116 and Grant JZ2020HGTB0037; in part by the University Synergy Innovation Program of Anhui Province under Grant GXXT-2019-030; in part by the Jiangsu Industrial Technology Research Institute, China; and in part by the U.S. NSF Engineering Research Center for Power Optimization of Electro-Thermal Systems (POETS) under Award EEC 1449548.
PY - 2022/2/1
Y1 - 2022/2/1
N2 - This article presents a physical model for monolithic self-rolled-up microtube interdigital capacitors and elaborates their working mechanisms in comparison to on-chip planar interdigital capacitors. Besides the high-frequency phenomena such as the skin effect in thin, wide metal films, the model accounts for the complexities resulting from all possible 3-D electrode configurations, such as the inner diameter-dependent overlapping capacitances and edge capacitances between electrodes, as well as parasitic inductances within the rolled-up structure between the fingers, for integer and noninteger number of turns. The model is validated by the measured results of fabricated self-rolled-up membrane (S-RuM) interdigital capacitors over a wide range of layout and process parameters. This fully enables the structural design optimization for electrical performance of this 3-D device architecture.
AB - This article presents a physical model for monolithic self-rolled-up microtube interdigital capacitors and elaborates their working mechanisms in comparison to on-chip planar interdigital capacitors. Besides the high-frequency phenomena such as the skin effect in thin, wide metal films, the model accounts for the complexities resulting from all possible 3-D electrode configurations, such as the inner diameter-dependent overlapping capacitances and edge capacitances between electrodes, as well as parasitic inductances within the rolled-up structure between the fingers, for integer and noninteger number of turns. The model is validated by the measured results of fabricated self-rolled-up membrane (S-RuM) interdigital capacitors over a wide range of layout and process parameters. This fully enables the structural design optimization for electrical performance of this 3-D device architecture.
KW - Capacitor model
KW - microtube interdigital capacitors
KW - on-chip interdigital capacitors
KW - self-rolled-up membrane (S-RuM)
UR - http://www.scopus.com/inward/record.url?scp=85120031558&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85120031558&partnerID=8YFLogxK
U2 - 10.1109/TCPMT.2021.3128884
DO - 10.1109/TCPMT.2021.3128884
M3 - Article
AN - SCOPUS:85120031558
SN - 2156-3950
VL - 12
SP - 359
EP - 367
JO - IEEE Transactions on Components, Packaging and Manufacturing Technology
JF - IEEE Transactions on Components, Packaging and Manufacturing Technology
IS - 2
ER -