TY - GEN
T1 - Physical model of image formation in multiple-image radiography
AU - Brankov, Jovan G.
AU - Khelashvili, Gocha
AU - Chapman, Dean
AU - Anastasio, Mark A.
AU - Yang, Yongyi
AU - Zhong, Zhong
AU - Wernick, Miles N.
PY - 2005
Y1 - 2005
N2 - We have recently proposed a new x-ray imaging method, called multiple-image radiography (MIR), which simultaneously produces images of absorption, refraction, and ultra-small-angle scatter, while rejecting higher-angle scatter. This paper presents a theoretical model of the relevant x-ray propagation mechanisms, thereby explaining why MIR works. Specifically, beam propagation is computed through a stratified scattering medium in an ultra-small-angle regime. This analysis demonstrates that the MIR images are linear with object thickness, which is a requirement for computed tomography by standard reconstruction methods.
AB - We have recently proposed a new x-ray imaging method, called multiple-image radiography (MIR), which simultaneously produces images of absorption, refraction, and ultra-small-angle scatter, while rejecting higher-angle scatter. This paper presents a theoretical model of the relevant x-ray propagation mechanisms, thereby explaining why MIR works. Specifically, beam propagation is computed through a stratified scattering medium in an ultra-small-angle regime. This analysis demonstrates that the MIR images are linear with object thickness, which is a requirement for computed tomography by standard reconstruction methods.
UR - http://www.scopus.com/inward/record.url?scp=33846592957&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33846592957&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2005.1596798
DO - 10.1109/NSSMIC.2005.1596798
M3 - Conference contribution
AN - SCOPUS:33846592957
SN - 0780392213
SN - 9780780392212
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 2320
EP - 2322
BT - 2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference
T2 - Nuclear Science Symposium Conference Record, 2005 IEEE
Y2 - 23 October 2005 through 29 October 2005
ER -