Abstract
We developed a novel label-free imaging approach, named Photonic Resonator Outcoupler Microscopy (PROM) utilizing the reduction of the peak-resonance intensity reflected from a photonic crystal surface. PROM can monitor the variation of focal adhesion areas in live cells dynamically and quantitatively for extended time.
| Original language | English (US) |
|---|---|
| Title of host publication | Frontiers in Optics, FIO 2018 |
| Publisher | OSA - The Optical Society |
| ISBN (Print) | 9781943580460 |
| DOIs | |
| State | Published - Jan 1 2018 |
| Event | Frontiers in Optics, FIO 2018 - Washington, DC, United States Duration: Sep 16 2018 → Sep 20 2018 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| Volume | Part F114-FIO 2018 |
Other
| Other | Frontiers in Optics, FIO 2018 |
|---|---|
| Country | United States |
| City | Washington, DC |
| Period | 9/16/18 → 9/20/18 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
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Cite this
Zhuo, Y., Choi, J. S., Marin, T., Yu, H., Harley, B. A., & Cunningham, B. T. (2018). Photonic resonator outcoupler microscopy (PROM) for quantitative monitoring of stem cell focal adhesion area. In Frontiers in Optics, FIO 2018 (Optics InfoBase Conference Papers; Vol. Part F114-FIO 2018). OSA - The Optical Society. https://doi.org/10.1364/FIO.2018.JTu3A.119