Abstract
Recent progress in the further characterization of microdischarge based photodetectors was reported. This recent report of photodetection by microdischarge devices opens up an entirely new application area. Thus, the results showed the photosensitivities of four different devices to changes in incident optical power from a He-Ne laser operating at 633 nm.
Original language | English (US) |
---|---|
Pages (from-to) | 857-858 |
Number of pages | 2 |
Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
Volume | 2 |
State | Published - 2003 |
Event | 2003 IEEE LEOS Annual Meeting Conference Proceedings - TUCSON, AZ, United States Duration: Oct 26 2003 → Oct 30 2003 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering