Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts

Johannes Russer, Aravind Ramachandran, Andreas C Cangellaris, Peter Russer

Research output: Contribution to journalConference article

Abstract

A methodology is proposed tor the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the development of PIM source models for metallic contacts that are compatible with general-purpose electromagnetic and network analysis-oriented, non-linear circuit simulators.

Original languageEnglish (US)
Article number4015119
Pages (from-to)1129-1132
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
DOIs
StatePublished - Dec 1 2006
Event2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, United States
Duration: Jun 11 2006Jun 16 2006

Keywords

  • Electron tunneling
  • Non-linear circuit simulation
  • Passive intermodulation
  • Transient electromagnetic field solvers

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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