Abstract
Figure Persented: Quantitative phase measurements in imaging, microscopy, and nanooptics provide information not carried in amplitude measurements alone. In this issue of ACS Nano, Honigstein et al. present a new method in phase measurement. In this Perspective, we comment on this work and more broadly on the emerging role of phase and phase measurements in nanooptics.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 8-12 |
| Number of pages | 5 |
| Journal | ACS Nano |
| Volume | 6 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 24 2012 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science
- General Engineering
- General Physics and Astronomy