Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

J. L. Campbell; R. G. Leigh; W. J. Teesdale

doi:10.1016/0168-583X(84)90567-6

Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

J. L. Campbell, R. G. Leigh, W. J. Teesdale

Research output: Contribution to journal › Article › peer-review

Abstract

The results of scanning a finely collimated beam of 5.9 keV X-rays across the faces of three different Si(Li) X-ray detectors are interpreted in terms of an active area of good charge collection and peripheral regions of incomplete charge collection, both within the manufacturers' stated areas. The data are correlated with absolute efficiencies determined using calibrated radionuclide X-ray ernitters. The hazards of spectral artefacts from the imperfect regions in the contexts of XRF and PIXE are stressed.

Original language	English (US)
Pages (from-to)	39-43
Number of pages	5
Journal	Nuclear Inst. and Methods in Physics Research, B
Volume	5
Issue number	1
DOIs	https://doi.org/10.1016/0168-583X(84)90567-6
State	Published - 1984
Externally published	Yes

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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10.1016/0168-583X(84)90567-6

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@article{f44aa218574a492c868f24ac684e8920,

title = "Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors",

abstract = "The results of scanning a finely collimated beam of 5.9 keV X-rays across the faces of three different Si(Li) X-ray detectors are interpreted in terms of an active area of good charge collection and peripheral regions of incomplete charge collection, both within the manufacturers' stated areas. The data are correlated with absolute efficiencies determined using calibrated radionuclide X-ray ernitters. The hazards of spectral artefacts from the imperfect regions in the contexts of XRF and PIXE are stressed.",

author = "Campbell, {J. L.} and Leigh, {R. G.} and Teesdale, {W. J.}",

note = "Funding Information: This work is supported by the Natural Sciences and Engineering Council of Canada. We are most grateful for the co-operation of Drs. W.F. Davidson, W.R. Di-xon and R.S. Storey of the National Research Council of Canada.",

year = "1984",

doi = "10.1016/0168-583X(84)90567-6",

language = "English (US)",

volume = "5",

pages = "39--43",

journal = "Nuclear Inst. and Methods in Physics Research, B",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

AU - Campbell, J. L.

AU - Leigh, R. G.

AU - Teesdale, W. J.

N1 - Funding Information: This work is supported by the Natural Sciences and Engineering Council of Canada. We are most grateful for the co-operation of Drs. W.F. Davidson, W.R. Di-xon and R.S. Storey of the National Research Council of Canada.

PY - 1984

Y1 - 1984

N2 - The results of scanning a finely collimated beam of 5.9 keV X-rays across the faces of three different Si(Li) X-ray detectors are interpreted in terms of an active area of good charge collection and peripheral regions of incomplete charge collection, both within the manufacturers' stated areas. The data are correlated with absolute efficiencies determined using calibrated radionuclide X-ray ernitters. The hazards of spectral artefacts from the imperfect regions in the contexts of XRF and PIXE are stressed.

AB - The results of scanning a finely collimated beam of 5.9 keV X-rays across the faces of three different Si(Li) X-ray detectors are interpreted in terms of an active area of good charge collection and peripheral regions of incomplete charge collection, both within the manufacturers' stated areas. The data are correlated with absolute efficiencies determined using calibrated radionuclide X-ray ernitters. The hazards of spectral artefacts from the imperfect regions in the contexts of XRF and PIXE are stressed.

UR - http://www.scopus.com/inward/record.url?scp=0021500922&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021500922&partnerID=8YFLogxK

U2 - 10.1016/0168-583X(84)90567-6

DO - 10.1016/0168-583X(84)90567-6

M3 - Article

AN - SCOPUS:0021500922

SN - 0168-583X

VL - 5

SP - 39

EP - 43

JO - Nuclear Inst. and Methods in Physics Research, B

JF - Nuclear Inst. and Methods in Physics Research, B

IS - 1

ER -

Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

Abstract

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