Abstract
The characteristics of newly developed 25 μm pixel size imaging plates with a detection area of 3000 x 3760 pixels are measured using the same methods applied for the slow-scan CCD (SSC) camera at various electron accelerating voltages. These are compared directly with the SSC camera. Examples of electron images recorded with the imaging plate and the SSC camera are given and analysed based on the measured camera characteristics. Advantages of each system are illustrated.
Original language | English (US) |
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Pages (from-to) | 35-47 |
Number of pages | 13 |
Journal | Ultramicroscopy |
Volume | 66 |
Issue number | 1-2 |
DOIs | |
State | Published - Nov 1996 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation