Penetration depth measurements of 3D XY critical behavior in YBa2Cu3O6.95 crystals

S. Kamal, D. A. Bonn, Nigel Goldenfeld, P. J. Hirschfeld, Ruixing Liang, W. N. Hardy

Research output: Contribution to journalArticlepeer-review

Abstract

We report measurements of the electromagnetic penetration depth λ(T) in nominally pure crystals of YBa2Cu3O6,95, for temperatures close to the critical temperature Tc. Over the range 0.001<(Tc-T)Tc<0.1, we find that λ(T)(1-TTc)-y with y0.33, consistent with the critical behavior of the three dimensional XY model. The measured critical behavior is not affected by the presence of small amounts of Zn impurities, in agreement with the Harris criterion.

Original languageEnglish (US)
Pages (from-to)1845-1848
Number of pages4
JournalPhysical review letters
Volume73
Issue number13
DOIs
StatePublished - 1994

ASJC Scopus subject areas

  • General Physics and Astronomy

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