Parasitic emission suppression in arrays of individually addressable silicon microcavity plasma devices

P. A. Tchertchian, T. M. Spinka, S. J. Park, J. G. Eden

Research output: Contribution to journalArticlepeer-review

Abstract

Full addressability of arrays of Si microcavity plasma devices has been demonstrated by adopting a split top electrode design. Arrays of pyramidal microcavities with emitting apertures of 100 × 100 μm2, a pixel pitch of 200 μm, and sizes as large as 512 × 512 pixels have been fabricated in 250-μm-thick Si(100) wafers. Parasitic capacitance is responsible for weak emission from adjacent microcavities when a single pixel is addressed but the suppression of nearest neighbor fluorescence with the current array design is ∼6 dB. Any pixel in the array can be addressed with an rms voltage as low as 240 V when the array is operating in 500 torr of Ne.

Original languageEnglish (US)
Pages (from-to)1254-1255
Number of pages2
JournalIEEE Transactions on Plasma Science
Volume36
Issue number4 PART 1
DOIs
StatePublished - Aug 2008

Keywords

  • Arrays
  • Cavity resonators
  • Electrodes
  • Fluorescence
  • Microcavities
  • Microcavity
  • Microplasma
  • Pixel
  • Plasma devices
  • Silicon

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Condensed Matter Physics

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