Parametric trace slicing

Feng Chen (Inventor), Grigore Rosu (Inventor), Patrick O Meredith (Inventor)

Research output: Patent


A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.
Original languageEnglish (US)
U.S. patent number8719796
Filing date1/24/11
StatePublished - May 6 2014


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