Parametric trace slicing

Feng Chen; Grigore Rosu; Patrick O Meredith

Parametric trace slicing

Feng Chen (Inventor), Grigore Rosu (Inventor), Patrick O Meredith (Inventor)

Research output: Patent

Abstract

A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.

Original language	English (US)
U.S. patent number	8719796
Filing date	1/24/11
State	Published - May 6 2014

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title = "Parametric trace slicing",

abstract = "A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.",

author = "Feng Chen and Grigore Rosu and Meredith, {Patrick O}",

note = "GOVERNMENT LICENSE This invention was made with Government support under Grant Numbers CCF-0448501, CNS-0509321, and CNS-0720512 awarded by the National Science Foundation (NSF), and Contract Number NNL08AA23C awarded by the National Aeronautics and Space Administration (NASA). The Government has certain rights in the invention.; 8719796",

year = "2014",

month = may,

day = "6",

language = "English (US)",

type = "Patent",

}

TY - PAT

T1 - Parametric trace slicing

AU - Chen, Feng

AU - Rosu, Grigore

AU - Meredith, Patrick O

N1 - GOVERNMENT LICENSE This invention was made with Government support under Grant Numbers CCF-0448501, CNS-0509321, and CNS-0720512 awarded by the National Science Foundation (NSF), and Contract Number NNL08AA23C awarded by the National Aeronautics and Space Administration (NASA). The Government has certain rights in the invention.

PY - 2014/5/6

Y1 - 2014/5/6

N2 - A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.

AB - A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.

M3 - Patent

M1 - 8719796

Y2 - 2011/01/24

ER -

Parametric trace slicing

Abstract

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