Parallelization of polarization state generation and detection for fast mueller matrix polarimetry

Santosh Tripathi, Kimani C. Toussaint

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Vector beams exhibit spatially inhomogeneous polarization. Here we show that this diversity of polarization in conjunction with specially designed optical setups can be used to parallelize the respective polarization state generation and detection processes in Mueller matrix polarimetry, which hitherto are done sequentially, limiting the speed with which samples can be characterized. Polarimetry based on these principles, that can extract twelve Mueller matrix elements from a single intensity image, is presented. Simulation results show that this form of polarimetry can be used to study a wide variety of samples such as magnetically active metamaterials.

Original languageEnglish (US)
Title of host publicationPolarization
Subtitle of host publicationMeasurement, Analysis, and Remote Sensing IX
DOIs
StatePublished - Dec 1 2010
EventPolarization: Measurement, Analysis, and Remote Sensing IX - Orlando, FL, United States
Duration: Apr 7 2010Apr 8 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7672
ISSN (Print)0277-786X

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing IX
CountryUnited States
CityOrlando, FL
Period4/7/104/8/10

Keywords

  • Metamaterials
  • Microscopy
  • Mueller matrix polarimetry
  • Nanomaterials
  • Polarimetry
  • Vector beams

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Tripathi, S., & Toussaint, K. C. (2010). Parallelization of polarization state generation and detection for fast mueller matrix polarimetry. In Polarization: Measurement, Analysis, and Remote Sensing IX (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7672). https://doi.org/10.1117/12.850270