Parallel-in-Space-Time Analysis of Electromagnetic Interference in Electronic Enclosures

Shu Wang, Zhen Peng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

There has been a growing and pressing need to rapidly evaluate the electromagnetic (EM) interference and susceptibility of electronic devices inside complex enclosures. To address this need, this paper leverages the time-domain wave physics to develop first-principles computational and predictive models. The temporal multi-scale challenge in analyzing longtime cavity transient dynamics is addressed by a new time-evolution Green's function and a space-time domain decomposition method. The research overcomes the time-step limitation and the sequential-in-time barrier, and achieves first-time a parallel-in-time capability for solving transient cavity problems. The results are valuable for the broadband analysis of EM emission and interference, shielding effectiveness and integrity, and integrated design of electronics and enclosures.

Original languageEnglish (US)
Title of host publicationEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages181-183
Number of pages3
ISBN (Electronic)9781538693032
DOIs
StatePublished - Nov 13 2018
Externally publishedYes
Event27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018 - San Jose, United States
Duration: Oct 14 2018Oct 17 2018

Publication series

NameEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems

Other

Other27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018
CountryUnited States
CitySan Jose
Period10/14/1810/17/18

Keywords

  • Domain decomposition
  • Electromagnetic interference
  • Electronic enclosure
  • Green's function
  • Time domain

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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