@inproceedings{703891de5a544f8f87121c4c6647db71,
title = "Parallel FETI-DP algorithm for defect detection in large-area nanopatterned wafers",
abstract = "An efficient parallelization of the dual-primal finite-element tearing and interconnecting algorithm (FETI-DP) is presented for detecting defects in large-area nanopatterned wafers. To reduce global communication, iterative solvers with an iterative classical Gram-Schmidt scheme and a communication-avoiding approach are implemented to solve the interface and the coarse corner problems, respectively. A preconditioner is developed to improve the iterative convergence of the coarse problem. Electromagnetic analysis of a wafer is presented to show the scalability and capability of the method for accurate defect detection.",
author = "Kedi Zhang and Goddard, {Lynford L.} and Jin, {Jian Ming}",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 ; Conference date: 13-03-2016 Through 17-03-2016",
year = "2016",
month = may,
day = "4",
doi = "10.1109/ROPACES.2016.7465398",
language = "English (US)",
series = "2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 IEEE/ACES International Conference on Wireless Information Technology, ICWITS 2016 and System and Applied Computational Electromagnetics, ACES 2016 - Proceedings",
address = "United States",
}