TY - GEN
T1 - Outlier Impact Characterization for Time Series Data
AU - Li, Jianbo
AU - Zheng, Lecheng
AU - Zhu, Yada
AU - He, Jingrui
N1 - Publisher Copyright:
Copyright © 2021, Association for the Advancement of Artificial Intelligence (www.aaai.org). All rights reserved.
PY - 2021
Y1 - 2021
N2 - For time series data, certain types of outliers are intrinsically more harmful for parameter estimation and future predictions than others, irrespective of their frequency. In this paper, for the first time, we study the characteristics of such outliers through the lens of the influence functional from robust statistics. In particular, we consider the input time series as a contaminated process, with the recurring outliers generated from an unknown contaminating process. Then we leverage the influence functional to understand the impact of the contaminating process on parameter estimation. The influence functional results in a multi-dimensional vector that measures the sensitivity of the predictive model to the contaminating process, which can be challenging to interpret especially for models with a large number of parameters. To this end, we further propose a comprehensive single-valued metric (the SIF) to measure outlier impacts on future predictions. It provides a quantitative measure regarding the outlier impacts, which can be used in a variety of scenarios, such as the evaluation of outlier detection methods, the creation of more harmful outliers, etc. The empirical results on multiple real data sets demonstrate the effectivenss of the proposed SIF metric.
AB - For time series data, certain types of outliers are intrinsically more harmful for parameter estimation and future predictions than others, irrespective of their frequency. In this paper, for the first time, we study the characteristics of such outliers through the lens of the influence functional from robust statistics. In particular, we consider the input time series as a contaminated process, with the recurring outliers generated from an unknown contaminating process. Then we leverage the influence functional to understand the impact of the contaminating process on parameter estimation. The influence functional results in a multi-dimensional vector that measures the sensitivity of the predictive model to the contaminating process, which can be challenging to interpret especially for models with a large number of parameters. To this end, we further propose a comprehensive single-valued metric (the SIF) to measure outlier impacts on future predictions. It provides a quantitative measure regarding the outlier impacts, which can be used in a variety of scenarios, such as the evaluation of outlier detection methods, the creation of more harmful outliers, etc. The empirical results on multiple real data sets demonstrate the effectivenss of the proposed SIF metric.
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M3 - Conference contribution
AN - SCOPUS:85116678970
T3 - 35th AAAI Conference on Artificial Intelligence, AAAI 2021
SP - 11595
EP - 11603
BT - 35th AAAI Conference on Artificial Intelligence, AAAI 2021
PB - Association for the Advancement of Artificial Intelligence
T2 - 35th AAAI Conference on Artificial Intelligence, AAAI 2021
Y2 - 2 February 2021 through 9 February 2021
ER -