Oscillatory transmission line pulsing for characterization of device transient response

James P. Di Sarro, Elyse Rosenbaum

Research output: Contribution to journalArticle

Abstract

An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.

Original languageEnglish (US)
Pages (from-to)168-170
Number of pages3
JournalIEEE Electron Device Letters
Volume30
Issue number2
DOIs
StatePublished - Jan 1 2009

Fingerprint

Electrostatic discharge
Transient analysis
Electric lines
Thyristors
Electric potential

Keywords

  • Electrostatic discharge (ESD)
  • Silicon-controlled rectifier (SCR)
  • Transmission line pulsing (TLP)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Oscillatory transmission line pulsing for characterization of device transient response. / Di Sarro, James P.; Rosenbaum, Elyse.

In: IEEE Electron Device Letters, Vol. 30, No. 2, 01.01.2009, p. 168-170.

Research output: Contribution to journalArticle

@article{5c403914098742fb9ab181c25ef34886,
title = "Oscillatory transmission line pulsing for characterization of device transient response",
abstract = "An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.",
keywords = "Electrostatic discharge (ESD), Silicon-controlled rectifier (SCR), Transmission line pulsing (TLP)",
author = "{Di Sarro}, {James P.} and Elyse Rosenbaum",
year = "2009",
month = "1",
day = "1",
doi = "10.1109/LED.2008.2009361",
language = "English (US)",
volume = "30",
pages = "168--170",
journal = "IEEE Electron Device Letters",
issn = "0741-3106",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",

}

TY - JOUR

T1 - Oscillatory transmission line pulsing for characterization of device transient response

AU - Di Sarro, James P.

AU - Rosenbaum, Elyse

PY - 2009/1/1

Y1 - 2009/1/1

N2 - An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.

AB - An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.

KW - Electrostatic discharge (ESD)

KW - Silicon-controlled rectifier (SCR)

KW - Transmission line pulsing (TLP)

UR - http://www.scopus.com/inward/record.url?scp=59649096186&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=59649096186&partnerID=8YFLogxK

U2 - 10.1109/LED.2008.2009361

DO - 10.1109/LED.2008.2009361

M3 - Article

AN - SCOPUS:59649096186

VL - 30

SP - 168

EP - 170

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

SN - 0741-3106

IS - 2

ER -