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Origin of the dielectric relaxation frequency in sliding-charge-density- wave systems
J. R. Tucker
, W. G. Lyons
, J. H. Miller
, R. E. Thorne
,
J. W. Lyding
Electrical and Computer Engineering
Beckman Institute for Advanced Science and Technology
Coordinated Science Lab
Materials Science and Engineering
Micro and Nanotechnology Lab
Research output
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peer-review
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Keyphrases
Dielectric Relaxation
100%
Relaxation Frequency
100%
Charge-density-wave Systems
100%
Charge Density Wave
66%
Low Temperature
33%
Randomly Distributed
33%
Bulk Crystal
33%
Current Oscillation
33%
Wave Polarization
33%
Threshold Field
33%
Natural Explanations
33%
Arrhenius Behavior
33%
AC-DC
33%
Strong pinning
33%
Carrier Screening
33%
High Frequency AC
33%
TAS3
33%
NbSe3
33%
Pinning Centers
33%
Engineering
Charge Density
100%
Dielectrics
100%
Low-Temperature
33%
Simple Model
33%
Arrhenius
33%
Bulk Crystal
33%
Decoupling Frequency
33%
Chemistry
Dielectric Relaxation
100%
Charge Density Wave
100%
Relaxation Frequency
100%
Material Science
Density
100%
Dielectric Material
100%
Earth and Planetary Sciences
Dielectric Material
100%
Decoupling
50%