Origin of the dielectric relaxation frequency in sliding-charge-density- wave systems

J. R. Tucker, W. G. Lyons, J. H. Miller, R. E. Thorne, J. W. Lyding

Research output: Contribution to journalArticlepeer-review


The charge-density-wave (CDW) dielectric relaxation frequency, which has been found to decrease at low temperatures according to an Arrhenius behavior in (TaSe4)2I and K0.3MoO3, is identified with the ac-dc decoupling frequency previously seen in TaS3 and NbSe3. A simple model is proposed based upon normal carrier screening of the CDW polarization created near randomly distributed "strong-pinning" centers within the bulk crystal. Relaxation frequencies calculated in terms of this model agree precisely with experiment. A wide range of phenomena associated with the nature of the threshold field, coherent current oscillations, and high-frequency ac response appear to have natural explanations within this context.

Original languageEnglish (US)
Pages (from-to)9038-9041
Number of pages4
JournalPhysical Review B
Issue number12
StatePublished - 1986

ASJC Scopus subject areas

  • Condensed Matter Physics


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