TY - GEN
T1 - Optimized CDM-ESD Protection for 100+ Gbps Wireline IO in 16-nm CMOS
AU - Huang, Shudong
AU - Rosenbaum, Elyse
N1 - The authors would like to thank the staff managing the Intel University Shuttle Program for all their support. Keysight is acknowledged for providing use of a UXR0334B 33-GHz real-time oscilloscope.
PY - 2025
Y1 - 2025
N2 - This work presents an ESD solution for high-speed serial IO pins, in which a STI-poly-bounded silicon-controlled rectifier (SCR) is integrated into an impedance matching circuit. The proposed all-pass secondary protection network provides excellent voltage clamping under CDM-like conditions, resulting in a peak voltage of just 2 V in response to 5-A 1-ns VFTLP current injection. Integrated with a T-coil circuit, the network achieves a bandwidth above 40 GHz, as well as broadband impedance matching.
AB - This work presents an ESD solution for high-speed serial IO pins, in which a STI-poly-bounded silicon-controlled rectifier (SCR) is integrated into an impedance matching circuit. The proposed all-pass secondary protection network provides excellent voltage clamping under CDM-like conditions, resulting in a peak voltage of just 2 V in response to 5-A 1-ns VFTLP current injection. Integrated with a T-coil circuit, the network achieves a bandwidth above 40 GHz, as well as broadband impedance matching.
KW - electrostatic discharge (ESD)
KW - FinFET
KW - silicon controlled rectifier (SCR)
UR - http://www.scopus.com/inward/record.url?scp=105005826308&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=105005826308&partnerID=8YFLogxK
U2 - 10.1109/IRPS48204.2025.10982711
DO - 10.1109/IRPS48204.2025.10982711
M3 - Conference contribution
AN - SCOPUS:105005826308
T3 - IEEE International Reliability Physics Symposium Proceedings
BT - 2025 IEEE International Reliability Physics Symposium, IRPS 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 IEEE International Reliability Physics Symposium, IRPS 2025
Y2 - 30 March 2025 through 3 April 2025
ER -