Optimization and sensitivity of the Keck Array

S. Kernasovskiy, P. A.R. Ade, R. W. Aikin, M. Amiri, S. Benton, C. Bischoff, J. J. Bock, J. A. Bonetti, J. A. Brevik, B. Burger, G. Davis, C. D. Dowell, L. Duband, J. P. Filippini, S. Fliescher, S. R. Golwala, M. Halpern, M. Hasselfield, G. Hiltion, V. V. HristovK. Irwin, J. M. Kovac, C. L. Kuo, E. Leitch, M. Lueker, C. B. Netterfield, H. T. Nguyen, R. O'Brient, R. W. Ogburn IV, C. L. Pryke, C. Reintsema, J. E. Ruhl, M. C. Runyan, R. Schwarz, C. D. Sheehy, Z. Staniszewski, R. Sudiwala, G. Teply, J. E. Tolan, A. D. Turner, A. Vieregg, D. V. Wiebe, P. Wilson, C. L. Wong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Keck Array (SPUD) began observing the cosmic microwave background's polarization in the winter of 2011 at the South Pole. The Keck Array follows the success of the predecessor experiments Bicep and Bicep2,1 using five on-axis refracting telescopes. These have a combined imaging array of 2500 antenna-coupled TES bolometers read with a SQUID-based time domain multiplexing system. We will discuss the detector noise and the optimization of the readout. The achieved sensitivity of the Keck Array is 11.5 μKCMB√s in the 2012 configuration.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
DOIs
StatePublished - 2012
Externally publishedYes
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI - Amsterdam, Netherlands
Duration: Jul 3 2012Jul 6 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8452
ISSN (Print)0277-786X

Other

OtherMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
Country/TerritoryNetherlands
CityAmsterdam
Period7/3/127/6/12

Keywords

  • Bicep2
  • Cosmic microwave background
  • Detector noise
  • Inflation
  • Keck array
  • Polarization
  • TES

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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