Optimal routing algorithms for pin clusters in high-density multichip modules

Muhammet Mustafa Ozdal, Martin D.F. Wang, Philip S. Honsinger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As the circuit densities and transistor counts are increasing, the package routing problem is becoming more and more challenging. In this paper, we study an important routing problem encountered in typical high-end MCM designs: routing within dense pin clusters. Pin clusters are often formed by pins that belong to the same functional unit or the same data bus, and can become bottlenecks in terms of overall routability. Typically, these clusters have irregular shapes, which can be approximated with rectilinear convex boundaries. Since such boundaries have often irregular shapes, a traditional escape routing algorithm may give unroutable solutions. In this paper, we study how the positions of escape terminals on a convex boundary affect the overall routability. For this purpose, we propose a set of necessary and sufficient conditions to model routability outside a rectilinear convex boundary. Given an escape routing solution, we propose an optimal algorithm to select the maximal subset of nets that are routable outside the boundary. After that, we focus on an integrated approach to consider routability constraints (outside the boundary) during the actual escape routing algorithm. Here, we propose an optimal algorithm to find the best escape routing solution that satisfies all routability constraints. Our experiments demonstrate that we can reduce the number of layers by 17% on the average, by using this integrated methodology.

Original languageEnglish (US)
Title of host publicationProceedings of theICCAD-2005
Subtitle of host publicationInternational Conference on Computer-Aided Design
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages767-774
Number of pages8
ISBN (Print)078039254X, 9780780392540
DOIs
StatePublished - 2005
EventICCAD-2005: IEEE/ACM International Conference on Computer-Aided Design, 2005 - San Jose, CA, United States
Duration: Nov 6 2005Nov 10 2005

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Volume2005
ISSN (Print)1092-3152

Other

OtherICCAD-2005: IEEE/ACM International Conference on Computer-Aided Design, 2005
Country/TerritoryUnited States
CitySan Jose, CA
Period11/6/0511/10/05

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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