TY - GEN
T1 - Optimal algorithm for minimizing the number of twists in an on-chip bus
AU - Deng, Liang
AU - Wong, Martin D.F.
PY - 2004
Y1 - 2004
N2 - Complementary bus architecture is used to achieve higher speed and lower power in VLSI chips. However, in deep submicron circuit design, the effects of crosstalk become more and more serious, especially in the bus structure where wires are placed close to each other. Complementary bus architecture with twisted wires can reduce the coupling noise. But in current chip design flow, engineering change order (ECO) happens commonly to meet improvement requirement. Layout changes due to ECO introduce obstacles to the twists, which could reduce the number of twists and increase the coupling noise. In this paper, an ECO algorithm for generating twisted complementary architecture is proposed based on the shortest path algorithm. Our algorithm guarantees to give the minimum number of twists along the bus wires under noise constraints. Experimental results show that the twist patterns generated by our algorithm can effectively reduce the capacitive coupling noises.
AB - Complementary bus architecture is used to achieve higher speed and lower power in VLSI chips. However, in deep submicron circuit design, the effects of crosstalk become more and more serious, especially in the bus structure where wires are placed close to each other. Complementary bus architecture with twisted wires can reduce the coupling noise. But in current chip design flow, engineering change order (ECO) happens commonly to meet improvement requirement. Layout changes due to ECO introduce obstacles to the twists, which could reduce the number of twists and increase the coupling noise. In this paper, an ECO algorithm for generating twisted complementary architecture is proposed based on the shortest path algorithm. Our algorithm guarantees to give the minimum number of twists along the bus wires under noise constraints. Experimental results show that the twist patterns generated by our algorithm can effectively reduce the capacitive coupling noises.
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U2 - 10.1109/DATE.2004.1269040
DO - 10.1109/DATE.2004.1269040
M3 - Conference contribution
AN - SCOPUS:3042558085
SN - 0769520855
SN - 9780769520858
T3 - Proceedings - Design, Automation and Test in Europe Conference and Exhibition
SP - 1104
EP - 1109
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
A2 - Gielen, G.
A2 - Figueras, J.
T2 - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
Y2 - 16 February 2004 through 20 February 2004
ER -