Optical sectioning by wide-field photobleaching imprinting microscopy

Chiye Li, Liang Gao, Yan Liu, Lihong V. Wang

Research output: Contribution to journalArticle

Abstract

We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.

Original languageEnglish (US)
Article number183703
JournalApplied Physics Letters
Volume103
Issue number18
DOIs
StatePublished - Oct 28 2013

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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