Optical sectioning by wide-field photobleaching imprinting microscopy

Chiye Li; Liang Gao; Yan Liu; Lihong V. Wang

doi:10.1063/1.4827535

Optical sectioning by wide-field photobleaching imprinting microscopy

Chiye Li, Liang Gao, Yan Liu, Lihong V. Wang

Research output: Contribution to journal › Article › peer-review

Abstract

We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.

Original language	English (US)
Article number	183703
Journal	Applied Physics Letters
Volume	103
Issue number	18
DOIs	https://doi.org/10.1063/1.4827535
State	Published - Oct 28 2013
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Online availability

10.1063/1.4827535

Library availability

Discover UIUC Full Text

Cite this

@article{24f2bcb01665409fa101caca067a2094,

title = "Optical sectioning by wide-field photobleaching imprinting microscopy",

abstract = "We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.",

author = "Chiye Li and Liang Gao and Yan Liu and Wang, {Lihong V.}",

note = "Funding Information: This work was sponsored in part by National Institutes of Health (NIH) grants DP1 EB016986 (NIH Director's Pioneer Award), R01 EB008085, R01 CA134539, U54 CA136398, R01 CA157277, and R01 CA159959. L.W. has a financial interest in Microphotoacoustics, Inc. and Endra, Inc., which, however, did not support this work.",

year = "2013",

month = oct,

day = "28",

doi = "10.1063/1.4827535",

language = "English (US)",

volume = "103",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "18",

}

TY - JOUR

T1 - Optical sectioning by wide-field photobleaching imprinting microscopy

AU - Li, Chiye

AU - Gao, Liang

AU - Liu, Yan

AU - Wang, Lihong V.

N1 - Funding Information: This work was sponsored in part by National Institutes of Health (NIH) grants DP1 EB016986 (NIH Director's Pioneer Award), R01 EB008085, R01 CA134539, U54 CA136398, R01 CA157277, and R01 CA159959. L.W. has a financial interest in Microphotoacoustics, Inc. and Endra, Inc., which, however, did not support this work.

PY - 2013/10/28

Y1 - 2013/10/28

N2 - We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.

AB - We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluorescence decay. Since no specific fluorescent dyes or illumination modules are required, wide-field PIM is easy to implement on a standard microscope. Moreover, wide-field PIM is superior to deconvolution microscopy in removing background fluorescence, yielding a six-fold improvement in image contrast.

UR - http://www.scopus.com/inward/record.url?scp=84889664288&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84889664288&partnerID=8YFLogxK

U2 - 10.1063/1.4827535

DO - 10.1063/1.4827535

M3 - Article

C2 - 24273331

AN - SCOPUS:84889664288

SN - 0003-6951

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

M1 - 183703

ER -

Optical sectioning by wide-field photobleaching imprinting microscopy

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this