Optical force microscopy: Combining light with atomic force microscopy for nanomaterial identification

Nusrat Jahan; Hanwei Wang; Shensheng Zhao; Arkajit Dutta; Hsuan Kai Huang; Yang Zhao; Yun Sheng Chen

doi:10.1515/nanoph-2019-0181

Optical force microscopy: Combining light with atomic force microscopy for nanomaterial identification

Nusrat Jahan, Hanwei Wang, Shensheng Zhao, Arkajit Dutta, Hsuan Kai Huang, Yang Zhao, Yun Sheng Chen

Research output: Contribution to journal › Article › peer-review

Abstract

Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

Original language	English (US)
Pages (from-to)	1659-1671
Number of pages	13
Journal	Nanophotonics
Volume	8
Issue number	10
DOIs	https://doi.org/10.1515/nanoph-2019-0181
State	Published - Oct 1 2019

Keywords

atomic force microscopy (AFM)
chirality
nanostructures
optical forces
polarization
structured light

ASJC Scopus subject areas

Biotechnology
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1515/nanoph-2019-0181License: CC BY

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title = "Optical force microscopy: Combining light with atomic force microscopy for nanomaterial identification",

abstract = "Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.",

keywords = "atomic force microscopy (AFM), chirality, nanostructures, optical forces, polarization, structured light",

author = "Nusrat Jahan and Hanwei Wang and Shensheng Zhao and Arkajit Dutta and Huang, {Hsuan Kai} and Yang Zhao and Chen, {Yun Sheng}",

note = "Publisher Copyright: {\textcopyright} 2019 Yang Zhao and Yun-Sheng Chen et al. published by De Gruyter, Berlin/Boston.",

year = "2019",

month = oct,

day = "1",

doi = "10.1515/nanoph-2019-0181",

language = "English (US)",

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TY - JOUR

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T2 - Combining light with atomic force microscopy for nanomaterial identification

AU - Jahan, Nusrat

AU - Wang, Hanwei

AU - Zhao, Shensheng

AU - Dutta, Arkajit

AU - Huang, Hsuan Kai

AU - Zhao, Yang

AU - Chen, Yun Sheng

PY - 2019/10/1

Y1 - 2019/10/1

N2 - Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

AB - Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

KW - atomic force microscopy (AFM)

KW - chirality

KW - nanostructures

KW - optical forces

KW - polarization

KW - structured light

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Optical force microscopy: Combining light with atomic force microscopy for nanomaterial identification

Abstract

Keywords

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