Optical force microscopy: Combining light with atomic force microscopy for nanomaterial identification

Nusrat Jahan, Hanwei Wang, Shensheng Zhao, Arkajit Dutta, Hsuan Kai Huang, Yang Zhao, Yun Sheng Chen

Research output: Contribution to journalReview article

Abstract

Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

Original languageEnglish (US)
Pages (from-to)1659-1671
Number of pages13
JournalNanophotonics
Volume8
Issue number10
DOIs
StatePublished - Oct 1 2019

Keywords

  • atomic force microscopy (AFM)
  • chirality
  • nanostructures
  • optical forces
  • polarization
  • structured light

ASJC Scopus subject areas

  • Biotechnology
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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