OpenILT: An Open Source Inverse Lithography Technique Framework (Invited Paper)

Su Zheng, Bei Yu, Martin Wong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Semiconductor lithography is a key process for fabricating integrated circuits, but it suffers from various distortions and variations that affect the quality of the printed patterns. Optical proximity correction (OPC) is a technique to improve pattern fidelity and robustness, and inverse lithography technique (ILT) is a promising OPC method that optimizes the mask as an inverse problem of the imaging system. However, ILT is computationally expensive and challenging to implement at a full-chip scale. In this paper, we present OpenILT, an open-source ILT platform that supports the rapid development and evaluation of GPU-accelerated and AI-driven ILT methods. OpenILT provides a modular and flexible framework that integrates various ILT components, such as lithography simulation, objective functions, and evaluation metrics. It also offers a convenient interface to PyTorch, a popular deep learning library, to enable the implementation of GPU-accelerated and AI-driven ILT methods.

Original languageEnglish (US)
Title of host publicationProceedings of 2023 IEEE 15th International Conference on ASIC, ASICON 2023
EditorsFan Ye, Ting-Ao Tang
PublisherIEEE Computer Society
ISBN (Electronic)9798350312980
DOIs
StatePublished - 2023
Externally publishedYes
Event15th IEEE International Conference on ASIC, ASICON 2023 - Nanjing, China
Duration: Oct 24 2023Oct 27 2023

Publication series

NameProceedings of International Conference on ASIC
ISSN (Print)2162-7541
ISSN (Electronic)2162-755X

Conference

Conference15th IEEE International Conference on ASIC, ASICON 2023
Country/TerritoryChina
CityNanjing
Period10/24/2310/27/23

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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