TY - GEN
T1 - On thresholds for robust goodness-of-fit tests
AU - Unnikrishnan, Jayakrishnan
AU - Meyn, Sean
AU - Veeravalli, Venugopal V.
PY - 2010
Y1 - 2010
N2 - Goodness-of-fit tests are statistical procedures used to test the hypothesis H0 that a set of observations were drawn according to some given probability distribution. Decision thresholds used in goodness-of-fit tests are typically set for guaranteeing a target false-alarm probability. In many popular testing procedures results on the weak convergence of the test statistics are used for setting approximate thresholds when exact computation is infeasible. In this work, we study robust procedures for goodness-of-fit where accurate models are not available for the distribution of the observations under hypothesis H0. We develop procedures for setting thresholds in two specific examples a robust version of the Kolmogorov-Smirnov test for continuous alphabets and a robust version of the Hoeffding test for finite alphabets.
AB - Goodness-of-fit tests are statistical procedures used to test the hypothesis H0 that a set of observations were drawn according to some given probability distribution. Decision thresholds used in goodness-of-fit tests are typically set for guaranteeing a target false-alarm probability. In many popular testing procedures results on the weak convergence of the test statistics are used for setting approximate thresholds when exact computation is infeasible. In this work, we study robust procedures for goodness-of-fit where accurate models are not available for the distribution of the observations under hypothesis H0. We develop procedures for setting thresholds in two specific examples a robust version of the Kolmogorov-Smirnov test for continuous alphabets and a robust version of the Hoeffding test for finite alphabets.
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U2 - 10.1109/CIG.2010.5592803
DO - 10.1109/CIG.2010.5592803
M3 - Conference contribution
AN - SCOPUS:80051940474
SN - 9781424482641
T3 - 2010 IEEE Information Theory Workshop, ITW 2010 - Proceedings
BT - 2010 IEEE Information Theory Workshop, ITW 2010 - Proceedings
T2 - 2010 IEEE Information Theory Workshop, ITW 2010
Y2 - 30 August 2010 through 3 September 2010
ER -