On the study of generic cyclic redundancy code

John C. Chan, Shien Tai Pan, D. F. Wong

Research output: Contribution to journalArticle

Abstract

This paper describes a new method of analyzing the syndromes for multiple input Linear Feedback Shift Registers (LFSR). A matrix formulation is developed to simplify the analysis from traditional polynomial representation of Cyclic Code. In particular, the information contained in the syndrome is investigated. Based on this, the error detection and correction capability of the multiple input LFSR is investigated. The formulation provides an alternative analytical tool to the study of Cyclic Code and new insights to its practical application.

Original languageEnglish (US)
Pages (from-to)627-639
Number of pages13
JournalMicroelectronics Reliability
Volume34
Issue number4
DOIs
StatePublished - Apr 1994
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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