An experimental coherent electron microdiffraction pattern obtained from a sub-nanometer region of silicon is used to show that zero- and higher-order Laue zone Bragg reflections may make an important contribution to high-angle dark-field (HAD) STEM lattice images. For one commonly used HAD detector, contrast is expected to result mainly from interference between overlapping orders of the Bragg coherent convergent-beam electron diffraction pattern.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics