On-the-fly fidelity assessment for trajectory-based circuit macromodels

Saurabh K. Tiwary; Rob A. Rutenbar

doi:10.1109/CICC.2006.320884

On-the-fly fidelity assessment for trajectory-based circuit macromodels

Saurabh K. Tiwary, Rob A. Rutenbar

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Trajectory methods offer an attractive methodology for automated extraction of macromodels from a set of training simulations. A pervasive concern with models based on regression is the lack of certainty about where they fit correctly. We show how the unique structure of a scalable trajectory model allows it to monitor the "fidelity" of the fit automatically, and flag where additional model training is warranted. Experimental results demonstrate this self-monitoring ability in practical circuit examples.

Original language	English (US)
Title of host publication	Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages	185-188
Number of pages	4
DOIs	https://doi.org/10.1109/CICC.2006.320884
State	Published - Dec 1 2006
Event	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States Duration: Sep 10 2006 → Sep 13 2006

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
ISSN (Print)	0886-5930

Other

Other	IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Country	United States
City	San Jose, CA
Period	9/10/06 → 9/13/06

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/CICC.2006.320884

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Tiwary, SK & Rutenbar, RA 2006, On-the-fly fidelity assessment for trajectory-based circuit macromodels. in Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006., 4114935, Proceedings of the Custom Integrated Circuits Conference, pp. 185-188, IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, San Jose, CA, United States, 9/10/06. https://doi.org/10.1109/CICC.2006.320884

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