On-the-fly fidelity assessment for trajectory-based circuit macromodels

Saurabh K. Tiwary, Rob A. Rutenbar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Trajectory methods offer an attractive methodology for automated extraction of macromodels from a set of training simulations. A pervasive concern with models based on regression is the lack of certainty about where they fit correctly. We show how the unique structure of a scalable trajectory model allows it to monitor the "fidelity" of the fit automatically, and flag where additional model training is warranted. Experimental results demonstrate this self-monitoring ability in practical circuit examples.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006
Pages185-188
Number of pages4
DOIs
StatePublished - Dec 1 2006
EventIEEE 2006 Custom Integrated Circuits Conference, CICC 2006 - San Jose, CA, United States
Duration: Sep 10 2006Sep 13 2006

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Other

OtherIEEE 2006 Custom Integrated Circuits Conference, CICC 2006
CountryUnited States
CitySan Jose, CA
Period9/10/069/13/06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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